FYI: here is the output from the test(below).
I now have the NIOS processor running at 50MHz and all Critical Warnings removed
such that I have timing closure.
FYI: output results did not change from 200MHz case.
Thoughts on the pattern error?
Some kinda configuration adjustment for the NIOS or DDR2 HPCII in SOPC?
Thank-you.
OUTPUT
--------
ddr_test_fulldata: 1: wrote 00000001, test_addr 00000000, read_val 00000004, device 0
ddr_test_fulldata: 2: wrote 00000002, test_addr 00000004, read_val 00000004, device 0
ddr_test_fulldata: 3: wrote 00000004, test_addr 00000008, read_val 00000008, device 0
ddr_test_fulldata: 4: wrote 00000008, test_addr 0000000c, read_val 00000008, device 0
ddr_test_fulldata: 5: wrote 00000010, test_addr 00000010, read_val 00000040, device 0
ddr_test_fulldata: 6: wrote 00000020, test_addr 00000014, read_val 00000040, device 0
ddr_test_fulldata: 7: wrote 00000040, test_addr 00000018, read_val 00000080, device 0
ddr_test_fulldata: 8: wrote 00000080, test_addr 0000001c, read_val 00000080, device 0
ddr_test_fulldata: 9: wrote 00000100, test_addr 00000020, read_val 00000400, device 0
ddr_test_fulldata: 10: wrote 00000200, test_addr 00000024, read_val 00000400, device 0
ddr_test_fulldata: 11: wrote 00000400, test_addr 00000028, read_val 00000800, device 0
ddr_test_fulldata: 12: wrote 00000800, test_addr 0000002c, read_val 00000800, device 0
ddr_test_fulldata: 13: wrote 00001000, test_addr 00000030, read_val 00004000, device 0
ddr_test_fulldata: 14: wrote 00002000, test_addr 00000034, read_val 00004000, device 0
ddr_test_fulldata: 15: wrote 00004000, test_addr 00000038, read_val 00008000, device 0
ddr_test_fulldata: 16: wrote 00008000, test_addr 0000003c, read_val 00008000, device 0
ddr_test_fulldata: 17: wrote 00010000, test_addr 00000040, read_val 00040000, device 0
ddr_test_fulldata: 18: wrote 00020000, test_addr 00000044, read_val 00040000, device 0
ddr_test_fulldata: 19: wrote 00040000, test_addr 00000048, read_val 00080000, device 0
ddr_test_fulldata: 20: wrote 00080000, test_addr 0000004c, read_val 00080000, device 0
ddr_test_fulldata: 21: wrote 00100000, test_addr 00000050, read_val 00400000, device 0
ddr_test_fulldata: 22: wrote 00200000, test_addr 00000054, read_val 00400000, device 0
ddr_test_fulldata: 23: wrote 00400000, test_addr 00000058, read_val 00800000, device 0
ddr_test_fulldata: 24: wrote 00800000, test_addr 0000005c, read_val 00800000, device 0
ddr_test_fulldata: 25: wrote 01000000, test_addr 00000060, read_val 04000000, device 0
ddr_test_fulldata: 26: wrote 02000000, test_addr 00000064, read_val 04000000, device 0
ddr_test_fulldata: 27: wrote 04000000, test_addr 00000068, read_val 08000000, device 0
ddr_test_fulldata: 28: wrote 08000000, test_addr 0000006c, read_val 08000000, device 0
ddr_test_fulldata: 29: wrote 10000000, test_addr 00000070, read_val 40000000, device 0
ddr_test_fulldata: 30: wrote 20000000, test_addr 00000074, read_val 40000000, device 0
ddr_test_fulldata: 31: wrote 40000000, test_addr 00000078, read_val 80000000, device 0
ddr_test_fulldata: 32: wrote 80000000, test_addr 0000007c, read_val 80000000, device 0