Event no 119751
Hello,
I'm Ionela Hagighiol ,SQE from Flex, Romania and we have the below issue with this part manufactured by you.
Please advise how to proceed further.
Component details:
|
Material PN |
ALC3-1AB310260004_REP |
|
Material Description |
ICFPGA5SGXMA7N2F45I3NStratix5B |
|
Material SN or Lot Nr |
N/A |
|
Date Code or Part Mark |
1607 |
|
Supplier Name |
ARROW ASIA DISTRIBUTION GBR |
|
Supplier PN/MPN |
5SGXMA7N2F45I3N |
- Problem description: Rx SM BIP8 Error Count on L1CH2 during prechamber ramp-up from -5°C to 50°C
- Detected by: Customer field failure, failure confirmed by factory tests
- Quantity Affected: 1 PCS
- Failure Message: SM BIP8 Error Count on L1CH2 on PM
- Flex or Nokia analysis:
This unit failed in field at customer. At Flex factory tests it failed with Rx SM BIP8 Error Count on L1CH2 during prechamber ramp-up from -5°C to 50°C. The suspected component for the issue was Obelix component (ALC3-1AB310260004_REP) and was sent to be replaced. With the new component the unit passed tests. Obelix component to be sent to supplier to re-run tests and find root cause of failure.
Replacing the component solved the problem and card passed factory tests.
Hi Ionela,
Thank you for using Intel Community Forum.
The case will be continued support through email as confidential info is required.
Thanks!
Wani