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Altera_Forum
Honored Contributor
20 years agothere is my memory test result
nios2-terminal: connected to hardware target using JTAG UART on cable nios2-terminal: "USB-Blaster [USB-0]", device 1, instance 0 nios2-terminal: (Use the IDE stop button or Ctrl-C to terminate) <----> Nios II Memory Test. <----> This software example tests the memory in your system to assure it is working properly. This test is destructive to the contents of the memory it tests. Assure the memory being tested does not contain the executable or data sections of this code or the exception address of the system. ---------------------------------- Memory Test Main Menu ---------------------------------- a: Test RAM b: Test Flash c: Test EPCS Serial Flash q: Exit ---------------------------------- Select Choice (a-b): [Followed by <enter>]a Base address to start memory test: (i. e. 0x800000) >0x2000000 End Address: >0x20fffff Testing RAM from 0x2000000 to 0x20FFFFF -Data bus test passed -Address bus test passed -Byte and half-word access test passed -Testing each bit in memory device. . . failed at address 0x2000034 ---------------------------------- Memory Test Main Menu ---------------------------------- a: Test RAM b: Test Flash c: Test EPCS Serial Flash q: Exit ---------------------------------- Select Choice (a-b): [Followed by <enter>]b Enter the name of the CFI flash device to be opened, or just press <enter> to open "/dev/ext_flash") > -ERROR: Could not open /dev/ext_flash ---------------------------------- Memory Test Main Menu ---------------------------------- a: Test RAM b: Test Flash c: Test EPCS Serial Flash q: Exit ---------------------------------- Select Choice (a-b): [Followed by <enter>]c Enter the name of the EPCS flash device to be opened, or just press <enter> to open "/dev/epcs_controller") > -Successfully opened /dev/epcs_controller -Region 0 contains 8 blocks. -Checking Region 0 for erased blocks. -Block 5, at address 0x50000 is erased. -Would you like to test this block? (y/n)y -Starting Flash Test. -Testing "alt_write_flash" and "alt_read_flash". pass 1 - passed. pass 2 - passed. -Testing "alt_erase_flash_block". passed. -Testing "alt_write_flash_block". passed. -Testing unaligned writes. passed. -Returning block 5 to its erased state. -Flash tests complete. -Closing flash device "/dev/epcs_controller". ---------------------------------- Memory Test Main Menu ---------------------------------- a: Test RAM b: Test Flash c: Test EPCS Serial Flash q: Exit ---------------------------------- Select Choice (a-b): [Followed by <enter>]