Memory test failure
We met the high failure issue of 1SG280HN2F43E2VG on functional test, failure is 1.42% (4/280), DC is 2205.
below is test error information:
Error Message: TS MP Memory Diag MMC25.vi.ProxyCaller -> TS MP Memory Diag MMC25.vi: Timeout occurred while waiting for memory devices to initialize. Last state was: { "object": { "devices": { "32-bit": { "BIST Status": "Idle", "Device": "DDR4 32-bit: U12, U13", "Init State": [ "PLL Locked", "Initialized", "Calibrated" ], "status": "OK" }, "64-bit": { "BIST Status": "Idle", "Device": "DDR4 64-bit: U8, U9, U10, U11", "Init State": [ "Not Ready", "Calibration Failed", "PLL Locked", "Initialized" ], "status": "ERROR: S_tronDiag_CAL_FAILED" }, "8-bit": { "BIST Status": "Idle", "Device": "DDR4 8-bit: U5", "Init State": [ "PLL Locked", "Initialized", "Calibrated" ], "status": "OK" }, "DIMM": { "BIST Status": "Idle", "Device": "DDR4 DIMM: J14", "Init State": [ "PLL Locked", "Initialized", "Calibrated" ], "status": "OK" } }, "status": "ERROR: S_tronDiag_CAL_FAILED" } } [Error Code: 5000]
Now we have ready 4pcs samples and need your help to process analysis, thanks!