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Altera_Forum
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13 years ago

MAX-II input b-scan cell capability lost with "Input tri-stated" unused pin setting

Hello All, We used EPM2210F256C4 in a design which can not tolerate default internal pull-ups in a boundary-scan test. A dummy design was made with QII 12.0 web-ed. One pin used only and in De...
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Altera_Forum
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13 years ago

Answering to my own post.

It appears that even in this situation one has to enable "Always enable input buffers" as described in the document

IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX II Devices

It is said that this is necessary only if there are dedicated outputs, but apparently this is needed in this situation as well.

Procedure in the a.m. document:

1. On the Assignments menu, click Settings.

2. Under Category, select Assembler.

3. Turn on Always Enable Input Buffers.