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Altera_Forum
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13 years ago

What is mean of fast/slow 0C/85C model?

There are three models in STA, it seems there is little reference from Altera to explain what is the mean of these and which is most important (I guess this depends on where the FPGA chip is used). So What is mean of fast/slow 0C/85C model? Why are they called corner models?

What is the "corner" mean?

Thanks very much.

16 Replies

  • Altera_Forum's avatar
    Altera_Forum
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    actually I used to heat up my fpga(startix 4) to 100C with hot air gun then stop, switch off fans and then it goes up till 130C, stays there for minutes and still passed all my bit-true suite of tests(clk at 368MHz!). I did that over and over trying to reproduce some claimed issue. Very impressive devices but looks like some thing is no longer right. It keeps its configuration for some time then switches off dead.

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    Altera_Forum
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    --- Quote Start ---

    actually I used to heat up my fpga(startix 4) to 100C with hot air gun then stop, switch off fans and then it goes up till 130C, stays there for minutes and still passed all my bit-true suite of tests(clk at 368MHz!). I did that over and over trying to reproduce some claimed issue. Very impressive devices but looks like some thing is no longer right. It keeps its configuration for some time then switches off dead.

    --- Quote End ---

    Ouch, that's a bit extreme. I guess its one way to try and track down a bug :)
  • Altera_Forum's avatar
    Altera_Forum
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    Thanks all of you. All of your discussions make my understanding more clear.

    I think I can express the corner is the corner in 3D coordinate system。 In this coordinate system, the two axis are temperature, voltage, and process respectively. Fast 0C is in the corner which has (fastest silicon process, highest voltage, 0ºC )
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    Altera_Forum
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    To add a bit - in modern sub-micron processes the assumption that 0C is fast and +85C is slow could be no more true due to Temperature Inversion.

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    Altera_Forum
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    --- Quote Start ---

    Not quite.

    For a given process corner (ie, holding the process factor constant) and fixed voltage the FPGA will run faster at 0'C than it does at 85'C. This is a characteristic of the CMOS process.

    Again holding the process constant and at a constant die temperature, the FPGA will run faster at a higher voltage than at a lower voltage (within the operating voltage limits of the design).

    And lastly, for any fixed temperature and fixed voltage, there will be some FPGA die that run faster and some slower. This is process variability.

    So to robustly test a design over all operating parameters, one might use a fast process part running at low temperature and maximum voltage. And then use a slow process part running at high temperature and minimum operating voltage.

    Unless you are a high volume corporate customer of Altera's you won't ever be able to get 'fast' and 'slow' process corner parts (other than selecting -6 or -8 speed grades yourself). But you can test at high and low temp, and at high and low operating voltage.

    Commercial product developers (of which I was one) routinely do this multiple corner testing as part of the DVT (design validation test) process prior to volume manufacturing.

    --- Quote End ---

    I would say yes temperature inversion exists but is a new theme nowadays, look at this link:

    http://ziyang.eecs.umich.edu/~****rp/talp/papers/dasdan-temperature.pdf

    http://robert****.org/talp/papers/dasdan-temperature.pdf

    or may be google: dasdan-temperature.pdf

    as link is killed by this site due to bad name(di*k). Sorry Forum but that is the most important part of our anatomy and does show temperature inversion as well

    Already I have a design in Arria10 that consistently shows recovery/removal failures at 0 but not at 100 for same other conditions. I will assume it is temperature inversion.