MAX V 5M*** and MAX II -- Examine - Verify Failure

Hello
I only use the programmer . That is why I have documented the complete path I am taking above.

Am I doing something wrong ? is there something missing that I need to do ?

how do you do it in detail?

I found a Youtube video that shows that it should work - just like you say

https://www.youtube.com/watch?v=cw7H8Pn4UK0

I have no original POF files.
I can only read from working chips and then have to write new chips to repair defective devices.

The first error I made would be confirmed by the fact that I carried out the tests with an erased chip.
Here I was probably wrong in thinking that, similar to an EEprom (all FF), data of a CFM can also be read out and compared in the erased state.

I don't yet know why I get an error with a programmed chip on the functioning donor board.

If you set the security bit when programming, is it actually displayed during the examine that the content is protected?

if this would not be displayed then the chips could be protected - although the manufacturer has not yet protected any of the other chips in any way and the security bit is not displayed or the field is never hidden in any examine.

I have to create a own simple POF File for Testing