Honored Contributor
Honored ContributorThe suggeston to use substrate or clamp diode for temperature measurement isn't but a reminder to a general method used in semiconductor testing. The details have to be worked out. You are right, that we can't expect a similar ideal behavior as with a dedicated sensor diode built into Stratix devices. The diode characteristic must be possibly calibrated and we should be aware of supply rail voltage drops. Needless to say that the test current should be choosen with respect to maximum ratings.
I imagine, that the methode can be useful at least during development, not necessarily for regular operation due to possibly limited reproducibility. Regards, Frank
