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Altera_Forum's avatar
Altera_Forum
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8 years ago

carry chain delay difference between real test and Timequest analysis result

Hi all,

5CGXFC7D6F31C7N is used to implement a TDC in my design with QII14.0.

according to timequest analysis results, the average carry delays of adder in a ALM are 52ps, 46ps, 27ps, 26ps respectively for timing corner slow_1100mV_0c, slow_1100mV_85C, fast_1100mV_0c and fast_1100mV_85C.

however, real test shows that the average carry delay is only 11ps under room temperature (core voltage is 1118mV under test), and 11ps is not in the range of delay of four timing corners.

it seems timequest gives incorrect results.

could anyone explain this delay difference between real test and timequest?

why the delay value differs so much between real test and timequest result?

Regards,

ingdxdy

14 Replies

  • Altera_Forum's avatar
    Altera_Forum
    Icon for Honored Contributor rankHonored Contributor

    --- Quote Start ---

    Thanks much for your reply, Jerry, and sorry for my delayed response.

    As you said, there are two dedicated adders in a ALM, and according to TQ result, the second adder delay is 0ps, while the first adder contributes the main component of TDL.

    the granularity of delay element is not as uniform as in CIV, but this is not problem. i have seen other peoples works where they implement TDCs in 28nm(or 20nm?) Xilinx FPGAs, the delay elements there are either non-uniform and there exist many zero-wide bins.

    Generally, TDCs implemented in more advanced process FPGAs (28nm and below) need bin realignment, for IC delays including clock skews play a more important role than before to decide bins positions. the tuition of bins are arranged according to their physical locations should be adjusted.

    However, the purpose of my posting this thread is not to discuss how to implement TDCs in CycloneV, but the real test delay value is different from TQ result which makes me puzzled.

    B&W,

    ingdxdy

    --- Quote End ---

    Did you mean re-asign delay time to those 0ps cell?

    BTW, what's you test input hit? I can implement PLL generated HIT as calibration input, however, this can't be realized in CV or SIVGX devices.
  • Altera_Forum's avatar
    Altera_Forum
    Icon for Honored Contributor rankHonored Contributor

    --- Quote Start ---

    Thanks much for your reply, Jerry, and sorry for my delayed response.

    As you said, there are two dedicated adders in a ALM, and according to TQ result, the second adder delay is 0ps, while the first adder contributes the main component of TDL.

    the granularity of delay element is not as uniform as in CIV, but this is not problem. i have seen other peoples works where they implement TDCs in 28nm(or 20nm?) Xilinx FPGAs, the delay elements there are either non-uniform and there exist many zero-wide bins.

    Generally, TDCs implemented in more advanced process FPGAs (28nm and below) need bin realignment, for IC delays including clock skews play a more important role than before to decide bins positions. the tuition of bins are arranged according to their physical locations should be adjusted.

    However, the purpose of my posting this thread is not to discuss how to implement TDCs in CycloneV, but the real test delay value is different from TQ result which makes me puzzled.

    B&W,

    ingdxdy

    --- Quote End ---

    Hi ingdxdy,

    Recently, i implemented TDC in my CycloneIVGX devices. I found there were several (9 to 12) zero width bins. Did you meet this situation in your case? Also, i tried to do bin re-alignment, however, there was no effection. I attached my test result. The average bin width should be about 40 ps, but the biggest bin width is about 100ps.

    https://alteraforum.com/forum/attachment.php?attachmentid=14704&stc=1

    Thanks

    Jerry
  • BazingaWei's avatar
    BazingaWei
    Icon for New Contributor rankNew Contributor

    hi there,

    i noticed the same phenomenon and got the same question, did you get the answer for it?