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Altera_Forum
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12 years ago

What is best to do to test a custom circuit with large amount of data?

Hi everyone, I have implemented a electron-beam data decompression circuit in verilog-hdl. I need to run it and benchmark it with large amount of data (over 200 mega-bytes). I don't have any no...
Altera_Forum's avatar
Altera_Forum
Icon for Honored Contributor rankHonored Contributor
12 years ago

How are you going to exclude Nios II cycles used for some internal operations from your benchmark?

I suggest you following setup: you take Nios II, custom DMA, DDR2 and the module to be tested. When you start the benchmark, Nios II copies flash content to RAM and starts DMA and a counter. Your custom DMA feeds the tested module directly with data from DDR2. When tested module finishes the job, it sends an interrupt. Nios II stops a counter and prints the result..