Forum Discussion
Altera_Forum
Honored Contributor
18 years agoPaul,
What if you have a requirement to run a BIST on every power-up? It's not uncommon in high-reliability applications - especially ones with very long service lives. As for an answer to the original question, I wonder if it would be possible to somehow use the SEU error detection (CRC_Error) circuitry as part of a device test.