Forum Discussion
Altera_Forum
Honored Contributor
18 years agoHi,
Apparently both of the device lots that are failing are based on die revision G, which may be suffering from issue "Failed power-up into user mode for slow VCCINT rise times or VCCINT rise profiles with dips or noise near the power-on reset (POR) trip voltage." Please refer to http://www.altera.com/literature/ds/es_max_ii.pdf for more details. You could give it a try with new chips containing die revision code I or later to make sure that this does not occur. I don't know whether it would be possible for you to experiment with this, but let me know if you do get a chance to experiment. Hope this helps. Cheers, BD