Occasional Contributor
Super ContributorHi,
Thank you for contacting Intel community.
Kindly refer to reliability report for further information on quality reliability of the device.
https://www.intel.com/content/dam/www/programmable/us/en/pdfs/literature/rr/rr.pdf
Information for EP1S20F484I6N is limited as the device was obsolete few years back.
Regards,
Aiman
Occasional ContributoroK it's obselete but the principal is still the same. Remember I don't work at Intel.
I still don't see the "answer" to what is the acceptable "void" for this device?
In percentage or what? After you've reviewed the CSAM results, would this be a
"PASS" by Intel? If it "FAIL", what would cause it? and Would it result in any "Electrical" functions to "FAIL".
Urgent!, I'm running out of time. Wish to close case out ASAP, Many thanks!!
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