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Brad is talking of a hiccup. Can you describe what the influence of the hickup is ?
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I said "a hiccup from the kind of thing the automated SEU detection was meant for". I don't deal with this area, but I expect the documentation covers why to use this feature and how to make use of it. In an environment exposed to cosmic particles (some environments are exposed to more of them than others are), there is some chance of a particle flipping a bit. That's a probability-of-failure contributor that in some applications needs to be considered in addition to ordinary reliability. The odds of a cosmic particle disrupting FPGA operation are very low and can be ignored in many, probably the vast majority, of applications. (Again, I'm no expert on this.) SEU had already been mentioned in the thread, so to be complete I was just qualifying my statement about high long-term reliability when you operate within the spec limits because there is this other failure cause regardless of those operating conditions that some people need to consider.
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