MAX 10 fails wilt .pof after boundary scan test

Hi All ,

One MAX10(10M16DAF256I7G) out of 20 samples fails during .pof download with Quartus programmer.

nconfig/ nstatus /confdone have 10Kohm pull up at 3.0 volt (that's last power rails at powerup: 1,2 -> 2.5 -> 3.0)

DEV_OE 10 kohm pullup, DEV_CLR 10 kohm pullup.

.pof case

PROGRAM fails at 9 %. No log availAble.Confdone and nstatus rise high at the start then go low at the end.

VERIFY fails at 2 %. No log available.Confdone and nstatus rise high at the start then go low at the end.

except nstatus where a glitch to 3.0Volt every 3 msec appears .

ERASE successfully.No log available.Confdone and nstatus rise high at the start then go low at the end.

BLANK CHECK successfully. No log avaialble .Confdone and nstatus rise high at the start then go low at the end,

except nstatus where a glitch to 3.0Volt every 3 msec appears

EXAMINE successfully. No log available.Confdone and nstatus rise high at the start then go low at the end,

.sof case

PROGRAM successfully. No log available .Confdone and nstatus rise high at the start and remain high at the end .

Device goes in I/O user mode

.svf case (via gascon machine )

ERASE,PROGRAM,VERIFY successfully: Confdone and nstatus go High, but device seems not to be in User Mode.

is it possible that the device is in a sort of JTAG SECURE MODE ?

Earlier, Device passed through BOUADARY SCAN Test Machine, where .jam programming failed before to switch to .svf

Let me know if someone could help .

best regards

Andrea